Free charge carrier absorption in silicon at 800 nm
Date
2016
Journal Title
Journal ISSN
Volume Title
Publisher
Springer
Abstract
The transmission of a Ti:sapphire laser beam (c.w. and fs pulsed operation at 800 nm) through a 10-μm-thin oxidized silicon membrane at 45° angle of incidence at first increases with the incident laser power, then shows a maximum, and finally decreases considerably. This nonlinear transmission behavior is the same for c.w. and pulsed laser operation and mainly attributed to free charge carrier absorption (FCA) in Si. A simple FCA model is developed and tested.
Description
CITATION: Heisel, P.-C. et al. 2016. Free charge carrier absorption in silicon at 800 nm. Applied Physics B, 122:60, doi:10.1007/s00340-015-6308-5.
The original publication is available at https://www.springer.com/journal/340
The original publication is available at https://www.springer.com/journal/340
Keywords
Polarized beams (Nuclear physics), Free carrier absorption, Laser beams, Membranes, Silifcon -- Absorption, Nonlinear optics
Citation
Heisel, P.-C. et al. 2016. Free charge carrier absorption in silicon at 800 nm. Applied Physics B, 122:60, doi:10.1007/s00340-015-6308-5.